IEC 63287-1-2021 pdf download
IEC 63287-1-2021 pdf download.Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification. Since ICs contain very small feature sizes and are dense with complex geometry, they are susceptible to defects generated in manufacturing processes. Therefore, some lots classified as ‘good devices’ contain potential failures...
IEC 62969-2-2018 pdf download
IEC 62969-2-2018 pdf download.Semiconductor devices – Semiconductor interface for automotive vehicles – Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors. This part of IEC 62969 specifies procedures and definitions for measuring the efficiency of the wireless power transmission system for the automotive vehicles...
IEC 62047-41-2021 pdf download
IEC 62047-41-2021 pdf download.Semiconductor devices – Micro-electromechanical devices – Part 41: RF MEMS circulators and isolators. 4 Essential ratings and characteristics 4.1 Identification and types General description of the function of the RF MEMS circulator/isolator and their applications should be stated. The statement should include the details of manufacturing technologies...
IEC 62047-17-2015 pdf download
IEC 62047-17-2015 pdf download.Semiconductor devices – Micro-electromechanical devices – Part 17: Bulge test method for measuring mechanical properties of thin films. Pressuring device should be equipped to apply a specified continuous pressure with a controlled rate or a certain level of pressure to the membrane window to be bulged. Pressure...
IEC 60749-41-2020 pdf download
IEC 60749-41-2020 pdf download.Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices. The apparatus required for this test shall consist of a controlled temperature chamber capable of maintaining the specified temperature conditions to within ±5 °C. Sockets or other mounting...
IEC 60749-12-2018 pdf download
IEC 60749-12-2018 pdf download.Semiconductor devices – Mechanical and climatic test methods Part 12: Vibration, variable frequency. This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable...
EN IEC 62969-2-2018 pdf download
EN IEC 62969-2-2018 pdf download.Semiconductor devices – Semiconductor interface for automotive vehicles Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors. This part of IEC 62969 specifies procedures and definitions for measuring the efficiency of the wireless power transmission system for the automotive vehicles...
BS IEC 62047-31-2019 pdf download
BS IEC 62047-31-2019 pdf download.Semiconductor devices – Micro- electromechanical devices Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials. 5 Testing method and test apparatus 5.1 Test principle The test is performed by applying a pure bending moment to a test piece with a layered...
BS IEC 62047-32-2019 pdf download
BS IEC 62047-32-2019 pdf download.Semiconductor devices — Micro- electromechanical devices Part 32: Test method for the nonlinear vibration of MEMS resonators. This part of IEC 62047 specifies the test method and test condition for the nonlinear vibration of MEMS resonators. The statements made in this document apply to the development...
BS IEC-63068-3-2020 pdf download
BS IEC-63068-3-2020 pdf download.Semiconductor devices — Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 3: Test method for defects using photoluminescence. 4 Photoluminescence method 4.1 General Defects with characteristic PL features shall be evaluated by PL method. The following descriptions concern such defects in...